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Название: Advanced Circuits For Emerging Technologies Автор(ы): Iniewski K. (ed.) Издательство: John Wiley & Sons Год: 2012 Страниц: 613 Формат: PDF Размер:15 Мб Язык: English
The book addresses the state of the art in integrated circuit design in the context of emerging systems. New exciting opportunities in body area networks, wireless communications, data networking, and optical imaging are discussed. Emerging design techniques for digital, power management, analog, and RF circuits are explored. Device layout, reliability, and testing techniques are described as well. The book is a must for anyone serious about circuit design for future technologies. The book is written by top-notch international experts in industry and academia. The intended audience is practicing engineers with integrated circuit background. The book can also be used as a recommended reading and supplementary material in graduate course curriculum. Intended audience consists of professionals working in the integrated circuit design field. To our knowledge, this is the only book on the market that covers circuits for emerging technologies beyond standard CMOS circuit books. The book is divided into four parts. Part I covers digital design and power management. Traditional constant-field scaling has led CMOS technology to continuous improvements in speed performances while maintaining constant power density. However, continuous increase in energy consumption as a result of that scaling has become the major concern limiting the speed performances of VLSI integrated circuits. For these reasons, power optimization and power management is a major focus of the first part. Part II covers analog and RF wireless circuits. Various chapters have been included to address SOI technology, low-power design, frequency control, and LED displays. The increasing demand for portable communication systems has motivated coverage of development on wireless transceivers. Device layout and reliability topics are covered in Part III. Major emphasis has been placed on dealing with parasitic effects in device layout and reliability concerned in nanoscale MOSFETs. Finally, the book concludes with Part IV that covers ever-increasingly issue of device testing.
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