Название: On-Wafer Microwave Measurements and De-embedding Автор: Errikos Lourandakis Издательство: Artech House Год: 2016 Формат: PDF Размер: 6 Мб Язык: английский / English
This new authoritative resource presents the basics of network analyzer measurement equipment and troubleshooting errors involved in the on-wafer microwave measurement process. This book bridges the gap between theoretical and practical information using real-world practices that address all aspects of on-wafer passive device characterization in the microwave frequency range up to 60GHz. Readers find data and measurements from silicon integrated passive devices fabricated and tested in advance CMOS technologies.
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On-Wafer Microwave Measurements and De-embedding 
